Investigating the chain conformations of spin‐coated polymer thin films by ToF‐SIMS depth profiling. (18th August 2015)

• Record Type: Journal Article
• Authors: Ren, Xianwen; Weng, Lu‐Tao; Fu, Yi; Ng, Kai‐Mo; Chan, Chi‐Ming
• Is Part Of: Surface and interface analysis. Volume 47:Number 10(2015)
• Page Start: 953
• Page End: 960
• Publication Date: 2015-08-18
• Subjects: ToF‐SIMS depth profiling -- polymer thin films -- chain conformation -- end groups; Surfaces (Physics) -- Periodicals; Surface chemistry -- Periodicals; Thin films -- Periodicals; 541.33
• DOI: 10.1002/sia.5801
• Languages: English
• ISSNs: 0142-2421

Abstract

Abstract : Thin films of bromine‐terminated poly(bisphenol A octane ether) (BA‐C10) were prepared using 1, 2‐dichlorobenzene (ODCB) as the solvent. The organization of the chains in these amorphous polymer films was evaluated using time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) depth profiling. For the thin films, the bifunctional polymer chains were folded and anchored to the substrate via their two Br end groups and a polymer brush of chain loops was formed on the substrate. As the film thickness increased, polymer chains in a random coil conformation were found to reside on the top of the polymer brush. Depth profiling revealed that the polymer chains were densely packed at the interface. Moreover, the polymer films showed thermal stability, implying strong interactions between the end groups and the substrate. Copyright © 2015 John Wiley & Sons, Ltd.