Coherent X-ray diffraction for domain observation II. (11th June 2017)

• Record Type: Journal Article
• Authors: Ohwada, K.; Shimizu, D.; Mizuki, J.; Fujiwara, K.; Nagata, T.; Ikeda, N.; Ohwa, H.; Yasuda, N.; Namikawa, K.
• Is Part Of: Ferroelectrics. Volume 513(2017)
• Page Start: 16
• Page End: 21
• Publication Date: 2017-06-11
• Subjects: Coherent X-ray diffraction -- ferroelectrics -- domain; Ferroelectricity -- Periodicals; Ferroelectric crystals -- Periodicals; 537
• DOI: 10.1080/00150193.2017.1350058
• Languages: English
• ISSNs: 0015-0193

Abstract

ABSTRACT: The CXD method have been shown to be applicable to the crystal characterization as well as the domain observation. The present CXD technique could evaluate the crystal coherence length up to 10 μm and the wide variety of samples were chosen in this study. We have shown how the ideal Bragg reflection deforms as the disorder and the defects increases and form the speckle patterns, the typical scattering patterns of CXD, by changing the samples. Finally we have successfully observed the μm/sub-μm domain arrangements in LuFe2 O4 /(1− x )Pb(Zn1/3 Nb2/3 )O3 - x PbTiO3 ( x = 0.09), where it is hard to be observed by the conventional diffraction techniques.