2017 atomic spectrometry update – a review of advances in X-ray fluorescence spectrometry and its special applications. Issue 9 (21st July 2017)

• Record Type: Journal Article
• Authors: West, Margaret; Ellis, Andrew T.; Streli, Christina; Vanhoof, Christine; Wobrauschek, Peter
• Is Part Of: Journal of analytical atomic spectrometry. Volume 32:Issue 9(201)
• Page Start: 1629
• Page End: 1649
• Publication Date: 2017-07-21
• Subjects: Atomic spectra -- Periodicals; Atomic absorption spectroscopy -- Periodicals; 543.0858
• DOI: 10.1039/c7ja90035j
• Languages: English
• ISSNs: 0267-9477

Abstract

Abstract : This review covers developments in and applications of XRF techniques such as EDXRF, WDXRF, TXRF, XRF microscopy using technologies such as synchrotron sources, X-ray optics, X-ray tubes and detectors in laboratory, mobile and hand-held systems. Abstract : This review describes advances in the XRF group of techniques published approximately between April 2016 and March 2017. With technique maturity, it is the sample rather than the instrumentation that limits its wider development, so regular readers are advised to consult our companion application updates for advances in XRF related to specific sample types. In this reconfigured update the Instrumentation section offers advances in hardware and software developments for off-site and laboratory investigations including synchrotron, TXRF and related techniques. However, publications that reflect increasing interest in the non-destructive advantages of X-ray systems for cultural heritage applications remain within this update.