X-Ray Microscopy as an Approach to Increasing Accuracy and Efficiency of Serial Block-Face Imaging for Correlated Light and Electron Microscopy of Biological Specimens. (13th November 2014)
- Record Type:
- Journal Article
- Title:
- X-Ray Microscopy as an Approach to Increasing Accuracy and Efficiency of Serial Block-Face Imaging for Correlated Light and Electron Microscopy of Biological Specimens. (13th November 2014)
- Main Title:
- X-Ray Microscopy as an Approach to Increasing Accuracy and Efficiency of Serial Block-Face Imaging for Correlated Light and Electron Microscopy of Biological Specimens
- Authors:
- Bushong, Eric A.
Johnson, Donald D.
Kim, Keun-Young
Terada, Masako
Hatori, Megumi
Peltier, Steven T.
Panda, Satchidananda
Merkle, Arno
Ellisman, Mark H. - Abstract:
- Abstract: The recently developed three-dimensional electron microscopic (EM) method of serial block-face scanning electron microscopy (SBEM) has rapidly established itself as a powerful imaging approach. Volume EM imaging with this scanning electron microscopy (SEM) method requires intense staining of biological specimens with heavy metals to allow sufficient back-scatter electron signal and also to render specimens sufficiently conductive to control charging artifacts. These more extreme heavy metal staining protocols render specimens light opaque and make it much more difficult to track and identify regions of interest (ROIs) for the SBEM imaging process than for a typical thin section transmission electron microscopy correlative light and electron microscopy study. We present a strategy employing X-ray microscopy (XRM) both for tracking ROIs and for increasing the efficiency of the workflow used for typical projects undertaken with SBEM. XRM was found to reveal an impressive level of detail in tissue heavily stained for SBEM imaging, allowing for the identification of tissue landmarks that can be subsequently used to guide data collection in the SEM. Furthermore, specific labeling of individual cells using diaminobenzidine is detectable in XRM volumes. We demonstrate that tungsten carbide particles or upconverting nanophosphor particles can be used as fiducial markers to further increase the precision and efficiency of SBEM imaging.
- Is Part Of:
- Microscopy and microanalysis. Volume 21:Number 1(2015:Feb.)
- Journal:
- Microscopy and microanalysis
- Issue:
- Volume 21:Number 1(2015:Feb.)
- Issue Display:
- Volume 21, Issue 1 (2015)
- Year:
- 2015
- Volume:
- 21
- Issue:
- 1
- Issue Sort Value:
- 2015-0021-0001-0000
- Page Start:
- 231
- Page End:
- 238
- Publication Date:
- 2014-11-13
- Subjects:
- X-ray microscopy, -- microcomputed tomography, -- serial block-face scanning electron microscopy, -- correlative microscopy, -- upconverting nanoparticles
Microscopy -- Periodicals
Microchemistry -- Periodicals
502.82 - Journal URLs:
- https://academic.oup.com/mam ↗
http://journals.cambridge.org/action/displayJournal?jid=MAM ↗
http://link.springer.de/link/service/journals/10005/index.htm ↗
http://firstsearch.oclc.org ↗ - DOI:
- 10.1017/S1431927614013579 ↗
- Languages:
- English
- ISSNs:
- 1431-9276
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library HMNTS - ELD Digital store
- Ingest File:
- 4552.xml