Rietveld texture analysis from synchrotron diffraction images. II. Complex multiphase materials and diamond anvil cell experiments. Issue 3 (15th May 2014)

• Record Type: Journal Article
• Authors: Wenk, Hans-Rudolf; Lutterotti, Luca; Kaercher, Pamela; Kanitpanyacharoen, Waruntorn; Miyagi, Lowell; Vasin, Roman
• Is Part Of: Powder diffraction. Volume 29:Issue 3(2014)
• Page Start: 220
• Page End: 232
• Publication Date: 2014-05-15
• Subjects: texture analysis, -- synchrotron diffraction, -- Rietveld method, -- shale, -- diamond anvil cell, -- ferropericlase; Powder metallurgy -- Periodicals; Materials -- Analysis -- Periodicals; 620.1127
• DOI: 10.1017/S0885715614000360
• Languages: English
• ISSNs: 0885-7156

Abstract

Abstract : Synchrotron X-ray diffraction images are increasingly used to characterize crystallographic preferred orientation distributions (texture) of fine-grained polyphase materials. Diffraction images can be analyzed quantitatively with the Rietveld method as implemented in the software package Materials Analysis Using Diffraction. Here we describe the analysis procedure for diffraction images collected with high energy X-rays for a complex, multiphase shale, and for those collected in situ in diamond anvil cells at high pressure and anisotropic stress.