Far-Field High-Energy Diffraction Microscopy: A Non-Destructive Tool for Characterizing the Microstructure and Micromechanical State of Polycrystalline Materials. (31st August 2017)

Record Type:: Journal Article
Title:: Far-Field High-Energy Diffraction Microscopy: A Non-Destructive Tool for Characterizing the Microstructure and Micromechanical State of Polycrystalline Materials. (31st August 2017)
Main Title:: Far-Field High-Energy Diffraction Microscopy: A Non-Destructive Tool for Characterizing the Microstructure and Micromechanical State of Polycrystalline Materials
Authors:: Park, Jun-Sang
Zhang, Xuan
Kenesei, Peter
Wong, Su Leen
Li, Meimei
Almer, Jonathan
Abstract:
Is Part Of:: Microscopy today. Volume 25:Number 5(2017)
Journal:: Microscopy today
Issue:: Volume 25:Number 5(2017)
Issue Display:: Volume 25, Issue 5 (2017)
Year:: 2017
Volume:: 25
Issue:: 5
Issue Sort Value:: 2017-0025-0005-0000
Page Start:: 36
Page End:: 45
Publication Date:: 2017-08-31
Subjects:: Microscope and microscopy -- Periodicals
502.8
Journal URLs:: http://www.microscopy-today.com/ ↗
https://academic.oup.com/mt ↗
http://journals.cambridge.org/action/displayJournal?jid=MTO ↗
http://www.microscopy-today.com/jsp/mto/common/home.faces ↗
DOI:: 10.1017/S1551929517000827 ↗
Languages:: English
ISSNs:: 1551-9295
Deposit Type:: Legaldeposit
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:: British Library HMNTS - ELD Digital store
Ingest File:: 4486.xml