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HARVARD Citation
Hsieh, T. et al. (2017). A fault-analysis oriented re-design and cost-effectiveness evaluation methodology for error tolerant applications. Microelectronics journal. pp. 48-57. [Online].
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Hsieh, T. et al. (2017). A fault-analysis oriented re-design and cost-effectiveness evaluation methodology for error tolerant applications. Microelectronics journal. pp. 48-57. [Online].