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HARVARD Citation
Hoffmann, A. et al. (2017). A novel fast Fourier transform accelerated off‐grid exhaustive search method for cryo‐electron microscopy fitting. Journal of applied crystallography. 50 (4), pp. 1036-1047. [Online].
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Hoffmann, A. et al. (2017). A novel fast Fourier transform accelerated off‐grid exhaustive search method for cryo‐electron microscopy fitting. Journal of applied crystallography. 50 (4), pp. 1036-1047. [Online].