Elemental and chemical state depth analysis by combined use of a polycapillary and a thin wire in a synchrotron X‐ray microprobe. (21st February 2017)

• Record Type: Journal Article
• Authors: Iida, Atsuo
• Is Part Of: X-ray spectrometry. Volume 46:Number 4(2017)
• Page Start: 225
• Page End: 228
• Publication Date: 2017-02-21
• Subjects: Depth analysis -- X‐ray microbeam -- Confocal system -- Synchrotron radiation -- Chemical state; X-ray spectroscopy -- Periodicals; 543.62
• DOI: 10.1002/xrs.2750
• Languages: English
• ISSNs: 0049-8246

Abstract

Abstract : A simple method is proposed to improve the depth resolution of a conventional X‐ray confocal microscopy system by adding a thin wire close to the sample surface and upstream of the polycapillary in the exit channel. A depth resolution of around 10 μm is easily obtained. The detection efficiency is improved by a factor of two to three times, compared with the thin wire technique previously proposed. It is also shown that not only the elemental distribution but also the X‐ray absorption near‐edge structure (XANES) spectrum from locations below the sample surface can be obtained. Copyright © 2017 John Wiley & Sons, Ltd.