All-sputtered, flexible, bottom-gate IGZO/Al2O3 bi-layer thin film transistors on PEN fabricated by a fully room temperature process. Issue 28 (7th July 2017)
- Record Type:
- Journal Article
- Title:
- All-sputtered, flexible, bottom-gate IGZO/Al2O3 bi-layer thin film transistors on PEN fabricated by a fully room temperature process. Issue 28 (7th July 2017)
- Main Title:
- All-sputtered, flexible, bottom-gate IGZO/Al2O3 bi-layer thin film transistors on PEN fabricated by a fully room temperature process
- Authors:
- Zheng, Zeke
Zeng, Yong
Yao, Rihui
Fang, Zhiqiang
Zhang, Hongke
Hu, Shiben
Li, Xiaoqing
Ning, Honglong
Peng, Junbiao
Xie, Weiguang
Lu, Xubing - Abstract:
- Abstract : In this work, an innovative all-sputtered bottom-gate thin film transistor (TFT) using an amorphous InGaZnO (IGZO)/Al2 O3 bi-layer channel was fabricated by fully room temperature processes on a flexible PEN substrate. Abstract : In this work, an innovative all-sputtered bottom-gate thin film transistor (TFT) using an amorphous InGaZnO (IGZO)/Al2 O3 bi-layer channel was fabricated by fully room temperature processes on a flexible PEN substrate. A bi-layer channel consisting of 10 nm-thick IGZO and 3 nm-thick Al2 O3 was clearly observed in high resolution TEM images. The chemical structure of IGZO was dependent on different sputtering modes (pulse-DC/DC/RF), which were investigated by XPS measurements. The ultrathin Al2 O3 layer on IGZO showed a significant effect on enhancing the mobility, reducing the off-state current, and improving the gate-bias stability. As a result, the IGZO/Al2 O3 bi-layer TFT eventually exhibited a saturation mobility of 18.5 cm 2 V −1 s −1, an I on / I off ratio of 10 7, an on-state voltage of 1.5 V and a subthreshold swing of 0.27 V decade −1, as well as good stability under NBS/PBS and bending strain. The fabrication of this TFT can be suitably transferred to large-size arrays or paper-like substrates, which is in line with the trend of display development.
- Is Part Of:
- Journal of materials chemistry. Volume 5:Issue 28(2017)
- Journal:
- Journal of materials chemistry
- Issue:
- Volume 5:Issue 28(2017)
- Issue Display:
- Volume 5, Issue 28 (2017)
- Year:
- 2017
- Volume:
- 5
- Issue:
- 28
- Issue Sort Value:
- 2017-0005-0028-0000
- Page Start:
- 7043
- Page End:
- 7050
- Publication Date:
- 2017-07-07
- Subjects:
- Materials -- Periodicals
Chemistry, Analytic -- Periodicals
Optical materials -- Research -- Periodicals
Electronics -- Materials -- Research -- Periodicals
543.0284 - Journal URLs:
- http://pubs.rsc.org/en/journals/journalissues/tc# ↗
http://www.rsc.org/ ↗ - DOI:
- 10.1039/c7tc02068f ↗
- Languages:
- English
- ISSNs:
- 2050-7526
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 5012.205300
British Library DSC - BLDSS-3PM
British Library STI - ELD Digital store - Ingest File:
- 2857.xml