Patch-based sparse reconstruction for electrical impedance tomography. Issue 3 (19th June 2017)

• Record Type: Journal Article
• Authors: Wang, Qi; Zhang, Pengcheng; Wang, Jianming; Chen, Qingliang; Lian, Zhijie; Li, Xiuyan; Sun, Yukuan; Duan, Xiaojie; Cui, Ziqiang; Sun, Benyuan; Wang, Huaxiang
• Is Part Of: Sensor review. Volume 37:Issue 3(2017)
• Page Start: 257
• Page End: 269
• Publication Date: 2017-06-19
• Subjects: Dictionary learning -- Image reconstruction -- Sparse representation -- Electrical impedance tomography; Sensor systems -- Periodicals; Detectors -- Industrial applications -- Periodicals; Engineering instruments -- Periodicals; 681.2
• DOI: 10.1108/SR-07-2016-0126
• Languages: English
• ISSNs: 0260-2288

Abstract

Abstract : Purpose: Electrical impedance tomography (EIT) is a technique for reconstructing the conductivity distribution by injecting currents at the boundary of a subject and measuring the resulting changes in voltage. Image reconstruction for EIT is a nonlinear problem. A generalized inverse operator is usually ill-posed and ill-conditioned. Therefore, the solutions for EIT are not unique and highly sensitive to the measurement noise. Design/methodology/approach: This paper develops a novel image reconstruction algorithm for EIT based on patch-based sparse representation. The sparsifying dictionary optimization and image reconstruction are performed alternately. Two patch-based sparsity, namely, square-patch sparsity and column-patch sparsity, are discussed and compared with the global sparsity. Findings: Both simulation and experimental results indicate that the patch based sparsity method can improve the quality of image reconstruction and tolerate a relatively high level of noise in the measured voltages. Originality/value: EIT image is reconstructed based on patch-based sparse representation. Square-patch sparsity and column-patch sparsity are proposed and compared. Sparse dictionary optimization and image reconstruction are performed alternately. The new method tolerates a relatively high level of noise in measured voltages.