Commercial Tests and Assembly in Silicon Photonics: Speeding production of single‐ and multi‐channel photonic devices with breakthrough parallel nanoalignment. Issue 3 (June 2017)

• Record Type: Journal Article
• Authors: Jordan, Scott
• Is Part Of: Optik & Photonik. Volume 12:Issue 3(2017)
• Page Start: 31
• Page End: 33
• Publication Date: 2017-06
• Subjects: Optics -- Periodicals; Photonics -- Periodicals; 621.3605
• DOI: 10.1002/opph.201700017
• Languages: English
• ISSNs: 1863-1460

Abstract

Abstract: As the world's appetite for data skyrockets, silicon photonics (SiP) promises fresh bounties of bandwidth, scalability and energy efficiency. The transformation of data transmission (and, soon, computational processes) from electronic to photonic is comparable to the development in integrated circuitry five decades ago: It is a fundamental shift that marks a watershed moment in the history of technology. However, there are many challenges to overcome to enable the practical, profitable manufacturing and testing of silicon photonic devices. Escalating demand – combined with the fundamental need for nanoscale‐accurate mutual orientation of miniscule photonic elements – necessitates robust, fast automation solutions.