Topological Darkness: Dispersion Topological Darkness at Multiple Wavelengths and Polarization States (Advanced Optical Materials 12/2017). Issue 12 (June 2017)

• Record Type: Journal Article
• Authors: Song, Haomin; Zhang, Nan; Duan, Jiyuan; Liu, Zhejun; Gao, Jun; Singer, Matthew H.; Ji, Dengxin; Cheney, Alec R.; Zeng, Xie; Chen, Borui; Jiang, Suhua; Gan, Qiaoqiang
• Is Part Of: Advanced optical materials. Volume 5:Issue 12(2017:Dec.)
• Page Start: n/a
• Page End: n/a
• Publication Date: 2017-06
• Subjects: ellipsometry -- nanoscale sensing -- nanostructures -- optical phases -- topological photonics; Optical materials -- Periodicals; Photonics -- Periodicals; 620.11295
• DOI: 10.1002/adom.201770060
• Languages: English
• ISSNs: 2195-1071

Abstract

Abstract : Complete suppression of reflection from a given flat or patterned surface is extremely difficult due to inherent roughness and fabrication errors. In article number1700166, Qiaoqiang Gan and co‐workers demonstrate a reflectionless thin film system based on topological effects in dispersion space for multi‐wavelengths and both polarization states using directly deposited thin films and random metal nanoparticles.