A microcontroller for in situ single‐crystal diffraction measurements with a PILATUS‐2M detector under an alternating electric field. Issue 3 (1st June 2017)

• Record Type: Journal Article
• Authors: Choe, Hyeokmin; Heidbrink, Stefan; Ziolkowski, Michael; Pietsch, Ullrich; Dyadkin, Vadim; Gorfman, Semën; Chernyshov, Dmitry
• Is Part Of: Journal of applied crystallography. Volume 50:Issue 3(2017)
• Page Start: 975
• Page End: 977
• Publication Date: 2017-06-01
• Subjects: in situ three‐dimensional reciprocal space mapping -- ferroelectric perovskites; Crystallography -- Periodicals; 548.05
• DOI: 10.1107/S1600576717006197
• Languages: English
• ISSNs: 0021-8898

Abstract

Abstract : A new data acquisition system is proposed for in situ single‐crystal diffraction with a pixel area detector under an alternating electric field. Abstract : A new data acquisition system for in situ time‐resolved three‐dimensional reciprocal space mapping is reported. The system is based on a programmable microcontroller for generating a functional low‐voltage signal, a pixel area detector serving as a master clock and a high‐voltage amplifier. Both Bragg and diffuse scattering can be mapped in a large volume of reciprocal space under an alternating electric field of a pre‐programmed shape. The system has been tested at the Swiss–Norwegian Beamline BM01 of the European Synchrotron by measuring the electric field dependence of diffuse X‐ray scattering from a functional perovskite‐based ferroelectric single crystal.