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HARVARD Citation
Wang, W. et al. (2017). Atomic mapping of structural distortions in 109° domain patterned BiFeO3 thin films. Journal of materials research. 32 (12), pp. 2423-2430. [Online].
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Wang, W. et al. (2017). Atomic mapping of structural distortions in 109° domain patterned BiFeO3 thin films. Journal of materials research. 32 (12), pp. 2423-2430. [Online].