Highly reliable mobile liquid crystal display using AlOx deposited by atomic layer deposition for side sealing structure. Issue 11 (3rd November 2015)

• Record Type: Journal Article
• Authors: Ishitani, Tetsuji; Kubota, Daisuke; Nakano, Masaru; Kubota, Yusuke; Moriya, Koji; Yamashita, Akio; Sakurada, Yujiro; Kusunoki, Koji; Shishido, Hideaki; Sugimoto, Kazuya; Hirakata, Yoshiharu; Yamazaki, Shunpei; Hayakawa, Masahiko
• Is Part Of: Journal of the Society for Information Display. Volume 23:Issue 11(2015:Nov.)
• Page Start: 503
• Page End: 509
• Publication Date: 2015-11-03
• Subjects: liquid crystal display -- atomic layer deposition -- high reliability -- narrow bezel -- low frequency driving -- CAAC‐IGZO; Information display systems -- Periodicals; 621.38154205
• DOI: 10.1002/jsid.390
• Languages: English
• ISSNs: 1071-0922

Abstract

Abstract: A side sealing structure including, outside a sealant, AlO x deposited using an atomic layer deposition apparatus was employed for a low‐frequency driving liquid crystal display (LCD) with a bezel width of 0.7 mm. This side‐sealing structure can effectively prevent the entry of external moisture. Prevention of decrease in voltage‐holding ratio was confirmed with a test cell having this structure. A narrow‐bezel LCD with c‐axis‐aligned a‐b‐plane‐anchored crystal In‐Ga‐Zn Oxide backplane can have long‐term high reliability as a low‐frequency driving LCD. Abstract : A side‐sealing structure, including, outside a sealant, AlO x deposited using an atomic layer deposition apparatus, was employed for a low‐frequency driving liquid crystal display with a bezel width of 0.7 mm. This side sealing structure can effectively prevent the entry of external moisture. Prevention of decrease in voltage holding ratio was confirmed. A narrow‐bezel display with c ‐axis‐aligned a ‐ b ‐plane‐anchored crystal In‐Ga‐Zn oxide backplane can have a long‐term high reliability as a low‐frequency driving display.