A precise measurement of the 117mSn half-life. (January 2017)

• Record Type: Journal Article
• Authors: Domingo, T.; Starosta, K.; Chester, A.; Williams, J.
• Is Part Of: Applied radiation and isotopes. Volume 119(2017:Jan.)
• Page Start: 101
• Page End: 104
• Publication Date: 2017-01
• Subjects: 117mSn -- Neutron activation -- Deadtime verification -- Time-resolved gamma-ray spectroscopy -- HPGe low-background counting -- Half-life; Radiology -- Periodicals; Radiation -- Industrial applications -- Periodicals; Nuclear chemistry -- Periodicals; Internet resource; Periodical; 660.298
• DOI: 10.1016/j.apradiso.2016.11.010
• Languages: English
• ISSNs: 0969-8043

Abstract

Abstractre: The 117m Sn isotope was produced via fast, 14.1 MeV neutron activation of natural tin and studied with a background shielded HPGe detector. To enable time-resolved γ -ray spectroscopy to precisely measure the half-life of 117m Sn, a commercial DAQ was replaced with a CAMAC-based analogue DAQ. The deadtime response of the applied DAQ was verified for the measurement. The half-life of 117m Sn was measured to be 13.91±0.03 days and the I(158.6 keV)/I(156.0 keV) γ -ray ratio was measured to be 43.6±1.5. Highlights: Sn-117m was measured via time-resolved gamma-ray spectroscopy. Event losses due to `busy' or pileup were measured for a deadtime correction. The measured half-life of Sn-117m was determined to be 13.91 ± 0.03 days.