Mitigated FPGA design of multi-gigabit transceivers for application in high radiation environments of High Energy Physics experiments. (October 2017)

• Record Type: Journal Article
• Authors: Brusati, M.; Camplani, A.; Cannon, M.; Chen, H.; Citterio, M.; Lazzaroni, M.; Takai, H.; Wirthlin, M.
• Is Part Of: Measurement. Volume 108(2017)
• Page Start: 171
• Page End: 192
• Publication Date: 2017-10
• Subjects: Measurement -- Instrumentation -- Reliability -- High Energy Physics -- FPGA -- Scrubbing; Weights and measures -- Periodicals; Measurement -- Periodicals; Measurement; Weights and measures; Periodicals; 530.8
• DOI: 10.1016/j.measurement.2017.02.025
• Languages: English
• ISSNs: 0263-2241

Abstract

Highlights: Devices operating in the harsh environment are called to work at high level of radiation. SRAM-based FPGA devices are very attractive for latest generation of HEP experiments. Mitigation techniques such as TMR and scrubbing increase the fault tolerance from SEU. Abstract: SRAM-based Field Programmable Gate Array (FPGA) logic devices are very attractive in applications where high data throughput is needed, such as the latest generation of High Energy Physics (HEP) experiments. FPGAs have been rarely used in such experiments because of their sensitivity to radiation. The present paper proposes a mitigation approach applied to commercial FPGA devices to meet the reliability requirements for the front-end electronics of the Liquid Argon (LAr) electromagnetic calorimeter of the ATLAS experiment, located at CERN. Particular attention will be devoted to define a proper mitigation scheme of the multi-gigabit transceivers embedded in the FPGA, which is a critical part of the LAr data acquisition chain. A demonstrator board is being developed to validate the proposed methodology. Mitigation techniques such as Triple Modular Redundancy (TMR) and scrubbing will be used to increase the robustness of the design and to maximize the fault tolerance from Single-Event Upsets (SEUs).