A Statistical Framework for Improved Automatic Flaw Detection in Nondestructive Evaluation Images. Issue 2 (3rd April 2017)

• Record Type: Journal Article
• Authors: Tian, Ye; Maitra, Ranjan; Meeker, William Q.; Holland, Stephen D.
• Is Part Of: Technometrics. Volume 59:Issue 2(2017)
• Page Start: 247
• Page End: 261
• Publication Date: 2017-04-03
• Subjects: Dynamic thresholding -- Image processing -- Matched filter -- Noise-interference model -- Probability of detection -- Signal-to-noise ratio; Statistical physics -- Periodicals; Chemistry -- Statistical methods -- Periodicals; Engineering -- Statistical methods -- Periodicals; 519.5
• DOI: 10.1080/00401706.2016.1153000
• Languages: English
• ISSNs: 0040-1706

Abstract

ABSTRACT: Nondestructive evaluation (NDE) techniques are widely used to detect flaws in critical components of systems like aircraft engines, nuclear power plants, and oil pipelines to prevent catastrophic events. Many modern NDE systems generate image data. In some applications, an experienced inspector performs the tedious task of visually examining every image to provide accurate conclusions about the existence of flaws. This approach is labor-intensive and can cause misses due to operator ennui. Automated evaluation methods seek to eliminate human-factors variability and improve throughput. Simple methods based on peak amplitude in an image are sometimes employed and a trained-operator-controlled refinement that uses a dynamic threshold based on signal-to-noise ratio (SNR) has also been implemented. We develop an automated and optimized detection procedure that mimics these operations. The primary goal of our methodology is to reduce the number of images requiring expert visual evaluation by filtering out images that are overwhelmingly definitive on the existence or absence of a flaw. We use an appropriate model for the observed values of the SNR-detection criterion to estimate the probability of detection. Our methodology outperforms current methods in terms of its ability to detect flaws. Supplementary materials for this article are available online.