Cite
HARVARD Citation
Liu, Y. et al. (2017). Temperature-dependent Optical Properties of AlN Thin Films by Spectroscopy Ellipsometry. MRS advances. pp. 323-328. [Online].
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Liu, Y. et al. (2017). Temperature-dependent Optical Properties of AlN Thin Films by Spectroscopy Ellipsometry. MRS advances. pp. 323-328. [Online].