Improving the spatial and statistical accuracy in X‐ray Raman scattering based direct tomography. (24th January 2017)

• Record Type: Journal Article
• Authors: Sahle, Ch. J.; Mirone, A.; Vincent, T.; Kallonen, A.; Huotari, S.
• Is Part Of: Journal of synchrotron radiation. Volume 24:Part 2(2017)
• Page Start: 476
• Page End: 481
• Publication Date: 2017-01-24
• Subjects: inelastic X‐ray scattering -- imaging -- direct tomography -- XRS; Synchrotron radiation -- Periodicals; Free electron lasers -- Periodicals; 539.73505
• DOI: 10.1107/S1600577517000169
• Languages: English
• ISSNs: 0909-0495

Abstract

Abstract : An algorithm to simultaneously increase the spatial and statistical accuracy of X‐ray Raman scattering based tomographic images is presented. Abstract : An algorithm to simultaneously increase the spatial and statistical accuracy of X‐ray Raman scattering (XRS) based tomographic images is presented. Tomography that utilizes XRS spectroscopy signals as a contrast for the images is a new and promising tool for investigating local atomic structure and chemistry in heterogeneous samples. The algorithm enables the spatial resolution to be increased based on a deconvolution of the optical response function of the spectrometer and, most importantly, it allows for the combination of data collected from multiple analyzers and thus enhances the statistical accuracy of the measured images.