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HARVARD Citation
Sen, B. et al. (2017). Design of reliable universal QCA logic in the presence of cell deposition defect. International journal of electronics. 104 (8), pp. 1285-1297. [Online].
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Sen, B. et al. (2017). Design of reliable universal QCA logic in the presence of cell deposition defect. International journal of electronics. 104 (8), pp. 1285-1297. [Online].