Cite
HARVARD Citation
Yue, L. et al. (2017). 170 keV Proton radiation effects on low-frequency noise of bipolar junction transistors. Radiation effects and defects in solids. 172 (3), pp. 313-322. [Online].
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
Yue, L. et al. (2017). 170 keV Proton radiation effects on low-frequency noise of bipolar junction transistors. Radiation effects and defects in solids. 172 (3), pp. 313-322. [Online].