Erosion yield and W surface enrichment of Fe-W model system exposed to low flux deuterium plasma in the linear device GyM. (January 2017)

• Record Type: Journal Article
• Authors: Caniello, R.; Uccello, A.; Ghezzi, F.; Minelli, D.; Radović, I. Bogdanović; Siketić, Z.; Cremona, A.; Dell'Era, F.; Gittini, G.; Mellera, V.; Pallotta, F.; Pedroni, M.; Ricci, D.; Spinicchia, N.; Vassallo, E.
• Is Part Of: Nuclear materials and energy. Volume 10(2017)
• Page Start: 9
• Page End: 16
• Publication Date: 2017-01
• Subjects: Eurofer -- Surface enrichment -- GyM -- Sputtering -- Iron-tungsten coating; Nuclear energy -- Periodicals; Nuclear fuels -- Periodicals; Nuclear reactors -- Materials -- Periodicals; Radioactive substances -- Periodicals; 621.4833
• DOI: 10.1016/j.nme.2017.01.014
• Languages: English
• ISSNs: 2352-1791

Abstract

Highlights: Iron-tungsten erosion yield dependence on deuterium plasma fluence. Tungsten surface enrichment due to selective iron sputtering with the plasma fluence. Iron-tungsten erosion yield dependence on samples' temperature. Tungsten surface enrichment with temperature due to thermal diffusion. Abstract: Iron-tungsten (Fe-W) mixed films were exposed to the low flux deuterium plasma of GyM in order to study the behavior of the sputtering yield with the ion fluence and temperature of the samples. From literature, it is known that an increase of the former lowers the Fe-W layers' sputtering yield as a consequence of the preferential sputtering of Fe leading to an enrichment in W of the outermost layers. An opposite trend was instead found for the latter probably due to the inter-diffusion of Fe and W (effective from 200 °C) resulting in the suppression of the W enrichment. Moreover, from 500 °C, also W segregation to the surface occurs. What is missing from literature is a systematic investigation of the role of temperature on W enrichment. In this work, dedicated experiments in GyM were carried out to fill this gap. After exposure, W enrichment was evaluated by Rutherford Backscattering Spectrometry (RBS) and inferred from measuring the eroded thickness of the samples using RBS and profilometer. Concerning the Fe-W sputtering yield as a function of fluence, it decreases by a factor of ∼3 between the lowest ( 3.0 × 10 22 D + m − 2 ) and the highest fluence ( 9.0 × 10 23 D + m − 2 ) values considered. The other main result is that, at the lowest fluence, the exposure at room temperature leads to an erosion of the Fe-W samples more pronounced than that associated to the exposure at 500 °C.