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HARVARD Citation
Yamaguchi, S. et al. (2017). Effective work-function control technique applicable to p-type FinFET high-k/metal gate devices. Microelectronics and reliability. pp. 80-84. [Online].
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Yamaguchi, S. et al. (2017). Effective work-function control technique applicable to p-type FinFET high-k/metal gate devices. Microelectronics and reliability. pp. 80-84. [Online].