Change of Crystallographic Orientation Characteristics of (001)-Oriented Electrodeposited Silver Films During Self-Annealing at Room Temperature. (2017)

• Record Type: Journal Article
• Authors: Hayashi, Yumi; Shohji, Ikuo; Koyama, Shinji; Miyazawa, Hiroshi
• Is Part Of: Procedia engineering. Volume 184(2017)
• Page Start: 725
• Page End: 731
• Publication Date: 2017
• Subjects: Electrodeposited silver film -- Self-annealing -- Electron back scatter diffraction patterns -- In situ observation -- Crystal orientation; Engineering -- Congresses; Engineering -- Periodicals; Engineering; Conference proceedings; Periodicals; 620.005
• DOI: 10.1016/j.proeng.2017.04.148
• Languages: English
• ISSNs: 1877-7058

Abstract

Abstract: Self-annealing behaviors of the electrodeposited silver films which preferentially orient in the (001) direction were investigated by in situ EBSD analysis. Self-annealing started in storage for a few hours at room temperature (R. T.) and was almost complete after storage for 6 h at R. T. In the initial stage of self-annealing, recrystallization of (001)-oriented grains progressed with the formation of twins with (212) orientation. Membrane stress in the as-electrodeposited film was compression stress of approximately 20 MPa. The compression membrane stress seems to become driving force for self-annealing of the (001)-oriented electrodeposited silver film. Membrane stress in the film changed from compression stress to tensile stress by recrystallization in self-annealing.