Cite
HARVARD Citation
Hagmann, M. et al. (2017). Microwave Frequency Comb from a Semiconductor in a Scanning Tunneling Microscope. Microscopy and microanalysis. pp. 443-448. [Online].
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Hagmann, M. et al. (2017). Microwave Frequency Comb from a Semiconductor in a Scanning Tunneling Microscope. Microscopy and microanalysis. pp. 443-448. [Online].