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Chen, Y. et al. (2017). Dynamic conductance characteristics in HfOx-based resistive random access memory. RSC advances. 7 (21), pp. 12984-12989. [Online].
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Chen, Y. et al. (2017). Dynamic conductance characteristics in HfOx-based resistive random access memory. RSC advances. 7 (21), pp. 12984-12989. [Online].