Atomic-resolution chemical mapping of ordered precipitates in Al alloys using energy-dispersive X-ray spectroscopy. (May 2017)
- Record Type:
- Journal Article
- Title:
- Atomic-resolution chemical mapping of ordered precipitates in Al alloys using energy-dispersive X-ray spectroscopy. (May 2017)
- Main Title:
- Atomic-resolution chemical mapping of ordered precipitates in Al alloys using energy-dispersive X-ray spectroscopy
- Authors:
- Wenner, Sigurd
Jones, Lewys
Marioara, Calin D.
Holmestad, Randi - Abstract:
- Highlights: Beam-sensitive Al-alloy precipitates were chemically mapped with EDS. Non-rigid registration was applied to correct for drift and scan distortions. Chemical maps were achieved with atomic resolution and high signal-to-noise ratio. Local elemental substitution was observed in single atomic columns. Abstract: Scanning transmission electron microscopy (STEM) coupled with energy-dispersive X-ray spectroscopy (EDS) is a common technique for chemical mapping in thin samples. Obtaining high-resolution elemental maps in the STEM is jointly dependent on stepping the sharply focused electron probe in a precise raster, on collecting a significant number of characteristic X-rays over time, and on avoiding damage to the sample. In this work, 80 kV aberration-corrected STEM-EDS mapping was performed on ordered precipitates in aluminium alloys. Probe and sample instability problems are handled by acquiring series of annular dark-field (ADF) images and simultaneous EDS volumes, which are aligned and non-rigidly registered after acquisition. The summed EDS volumes yield elemental maps of Al, Mg, Si, and Cu, with sufficient resolution and signal-to-noise ratio to determine the elemental species of each atomic column in a periodic structure, and in some cases the species of single atomic columns. Within the uncertainty of the technique, S and β" phases were found to have pure elemental atomic columns with compositions Al2 CuMg and Al2 Mg5 Si4, respectively. The Q' phase showed someHighlights: Beam-sensitive Al-alloy precipitates were chemically mapped with EDS. Non-rigid registration was applied to correct for drift and scan distortions. Chemical maps were achieved with atomic resolution and high signal-to-noise ratio. Local elemental substitution was observed in single atomic columns. Abstract: Scanning transmission electron microscopy (STEM) coupled with energy-dispersive X-ray spectroscopy (EDS) is a common technique for chemical mapping in thin samples. Obtaining high-resolution elemental maps in the STEM is jointly dependent on stepping the sharply focused electron probe in a precise raster, on collecting a significant number of characteristic X-rays over time, and on avoiding damage to the sample. In this work, 80 kV aberration-corrected STEM-EDS mapping was performed on ordered precipitates in aluminium alloys. Probe and sample instability problems are handled by acquiring series of annular dark-field (ADF) images and simultaneous EDS volumes, which are aligned and non-rigidly registered after acquisition. The summed EDS volumes yield elemental maps of Al, Mg, Si, and Cu, with sufficient resolution and signal-to-noise ratio to determine the elemental species of each atomic column in a periodic structure, and in some cases the species of single atomic columns. Within the uncertainty of the technique, S and β" phases were found to have pure elemental atomic columns with compositions Al2 CuMg and Al2 Mg5 Si4, respectively. The Q' phase showed some variation in chemistry across a single precipitate, although the majority of unit cells had a composition Al6 Mg6 Si7.2 Cu2 . … (more)
- Is Part Of:
- Micron. Volume 96(2017)
- Journal:
- Micron
- Issue:
- Volume 96(2017)
- Issue Display:
- Volume 96, Issue 2017 (2017)
- Year:
- 2017
- Volume:
- 96
- Issue:
- 2017
- Issue Sort Value:
- 2017-0096-2017-0000
- Page Start:
- 103
- Page End:
- 111
- Publication Date:
- 2017-05
- Subjects:
- Scanning transmission electron microscopy -- Energy-dispersive X-ray spectroscopy -- Aluminium alloys -- Precipitation
Microscopy -- Periodicals
Electron Probe Microanalysis -- Periodicals
Microscopy -- Periodicals
Microscopie -- Périodiques
Microscopy
Periodicals
502.82 - Journal URLs:
- http://www.elsevier.com/homepage/elecserv.htt ↗
http://www.sciencedirect.com/science/journal/09684328 ↗
http://www.elsevier.com/journals ↗ - DOI:
- 10.1016/j.micron.2017.02.007 ↗
- Languages:
- English
- ISSNs:
- 0968-4328
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 5759.300000
British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store - Ingest File:
- 1413.xml