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HARVARD Citation
Shen, Y. et al. (2017). An accurate model for predicting high frequency noise of nanoscale NMOS SOI transistors. Solid-state electronics. pp. 45-52. [Online].
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Shen, Y. et al. (2017). An accurate model for predicting high frequency noise of nanoscale NMOS SOI transistors. Solid-state electronics. pp. 45-52. [Online].