Failure mode and effect analysis of a large scale thin-film CIGS photovoltaic module. (June 2017)

• Record Type: Journal Article
• Authors: Delgado-Sanchez, Jose-Maria; Sanchez-Cortezon, Emilio; Lopez-Lopez, Carmen; Aninat, R.; Alba, Maria D.
• Is Part Of: Engineering failure analysis. Volume 76(2017)
• Page Start: 55
• Page End: 60
• Publication Date: 2017-06
• Subjects: CIGS -- FMEA -- Aging test -- Failure analysis -- Thin-film photovoltaic; System failures (Engineering) -- Periodicals; Fracture mechanics -- Periodicals; Reliability (Engineering) -- Periodicals; Pannes -- Périodiques; Rupture, Mécanique de la -- Périodiques; Fiabilité -- Périodiques; Fracture mechanics; Reliability (Engineering); System failures (Engineering); Periodicals; Electronic journals; 620.112
• DOI: 10.1016/j.engfailanal.2017.02.004
• Languages: English
• ISSNs: 1350-6307

Abstract

Abstract: The efficiency of thin-film CIGS based cells at the laboratory scale is now getting closer to conventional Silicon technologies. As a consequence, the long-term stability of CIGS is now one of the main challenges left to address in order to assess its potential as an alternative for photovoltaic plants. This paper reports an overview of the critical risks for the commercial viability of the CIGS thin-film technology. The key causes of the potential failures of this technology are determined through the Failure Mode Analysis and Effects (FMEA) methodology. To validate the results obtained from the FMEA, aging tests and outdoor monitoring were also carried out. Based on the results obtained, we argue that the encapsulation material is the main cause of degradation in CIGS modules. Highlights: Failure Mode and Effect Analysis (FMEA) methodology to identify thin-film risks CIGS thin-film modules submitted to aging tests to ensure their performance stability Outdoor monitoring is compared with climate chamber cycles to identify failure mode of CIGS thin-film modules.