Dielectric characterization using FEM modeling and ANNs for coaxial waveguide with conical open ended radiation. Issue 3 (8th March 2016)

• Record Type: Journal Article
• Authors: El Afendi, Mohamed Mounkid; Tellache, Mohamed; Tao, Junwu; Hadjadji, Bilal; Benmimoune, Mouncef
• Is Part Of: International journal of microwave and wireless technologies. Volume 9:Issue 3(2017)
• Page Start: 523
• Page End: 534
• Publication Date: 2016-03-08
• Subjects: Dielectric measurement, -- Coaxial open-ended waveguide, -- Finite element method, -- Radiation field, -- Neural networks; Wireless communication systems -- Periodicals; Microwave circuits -- Periodicals; Radio frequency -- Periodicals; 621.381305
• DOI: 10.1017/S1759078716000283
• Languages: English
• ISSNs: 1759-0787

Abstract

Abstract : Since last decades, microwaves have received tremendous attention as an interesting tool for material characterization. In general, standard microwave measurement methods require cutting and polishing of samples to put it in a suitable waveguide or cavity. However, several methods have been developed in order to permit a non-destructive measurement. A well-known method is based on coaxial open-ended waveguide, which is used as a sensor for dielectric characterizations. Moreover, with the requirement of new forms, developing mathematical model for each one is not convenient. Indeed, the complex structures required in the industrial field can be perfectly designed with high-performance three-dimensional software. Many attempts have been done to solve the conversion problem by proposing different algorithms. Nevertheless, they are sensitive for complex structure that contains transition part. In this paper, we propose a dielectric measurement method based on the use of coaxial waveguide. A novel algorithm for dielectric characterization of complex structures is also presented, which is based on the joint use of artificial neuronal networks and finite element method. The proposed algorithm aims to find the dielectric characterization for complex structures. Experimental evaluations applied to solid and liquid dielectrics confirm the validation of the proposed algorithm.