Cite
HARVARD Citation
Baek, K. et al. (2017). In situ TEM observation on the interface-type resistive switching by electrochemical redox reactions at a TiN/PCMO interface. Nanoscale. 9 (2), pp. 582-593. [Online].
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Baek, K. et al. (2017). In situ TEM observation on the interface-type resistive switching by electrochemical redox reactions at a TiN/PCMO interface. Nanoscale. 9 (2), pp. 582-593. [Online].