Cite
HARVARD Citation
Huang, Q. et al. (2017). A two-dimensional Fourier-series finite element for wrinkling analysis of thin films on compliant substrates. Thin-walled structures. pp. 144-153. [Online].
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Huang, Q. et al. (2017). A two-dimensional Fourier-series finite element for wrinkling analysis of thin films on compliant substrates. Thin-walled structures. pp. 144-153. [Online].