Calculations of electron inelastic mean free paths. XI. Data for liquid water for energies from 50 eV to 30 keV. (30th August 2016)

• Record Type: Journal Article
• Authors: Shinotsuka, H.; Da, B.; Tanuma, S.; Yoshikawa, H.; Powell, C. J.; Penn, D. R.
• Is Part Of: Surface and interface analysis. Volume 49:Number 4(2017)
• Page Start: 238
• Page End: 252
• Publication Date: 2016-08-30
• Subjects: electron inelastic mean free path -- IMFP -- liquid water -- relativistic full Penn algorithm -- relativistic TPP‐2M -- static structure factor -- effective attenuation length -- EAL; Surfaces (Physics) -- Periodicals; Surface chemistry -- Periodicals; Thin films -- Periodicals; 541.33
• DOI: 10.1002/sia.6123
• Languages: English
• ISSNs: 0142-2421

Abstract

Abstract : We calculated electron inelastic mean free paths (IMFPs) for liquid water from its optical energy‐loss function (ELF) for electron energies from 50 eV to 30 keV. These calculations were made with the relativistic full Penn algorithm that has been used for previous IMFP and electron stopping‐power calculations for many elemental solids. We also calculated IMFPs of water with three additional algorithms: the relativistic single‐pole approximation, the relativistic simplified single‐pole approximation, and the relativistic extended Mermin method. These calculations were made by using the same optical ELF in order to assess any differences of the IMFPs arising from choice of the algorithm. We found good agreement among the IMFPs from the four algorithms for energies over 300 eV. For energies less than 100 eV, however, large differences became apparent. IMFPs from the relativistic TPP‐2M equation for predicting IMFPs were in good agreement with IMFPs from the four algorithms for energies between 300 eV and 30 keV, but there was poorer agreement for lower energies. We calculated values of the static structure factor as a function of momentum transfer from the full Penn algorithm. The resulting values were in good agreement with results from first‐principle calculations and with inelastic X‐ray scattering spectroscopy experiments. We made comparisons of our IMFPs with earlier calculations from authors who had used different algorithms and different ELF data sets. IMFP differences could then be analyzed in terms of the algorithms and the data sets. Finally, we compared our IMFPs with measurements of IMFPs and of a related quantity, the effective attenuation length. There were large variations in the measured IMFPs and effective attenuation lengths (as well as their dependence on electron energy). Further measurements are therefore required to establish consistent data sets and for more detailed comparisons with calculated IMFPs. Copyright © 2016 John Wiley & Sons, Ltd.