Cite
HARVARD Citation
Schneider, M. et al. (n.d.). Spectroscopic reflectometry as in‐operando method for thickness determination of anodic oxide films on titanium. Surface and interface analysis. pp. 1247-1251. [Online].
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Schneider, M. et al. (n.d.). Spectroscopic reflectometry as in‐operando method for thickness determination of anodic oxide films on titanium. Surface and interface analysis. pp. 1247-1251. [Online].