Interference effects in the UV(VUV)‐excited luminescence spectroscopy of thin dielectric films. (1st March 2013)

• Record Type: Journal Article
• Authors: Buntov, Evgeny; Zatsepin, Anatoly
• Is Part Of: Journal of synchrotron radiation. Volume 20:Part 3(2013)
• Page Start: 509
• Page End: 514
• Publication Date: 2013-03-01
• Subjects: interference modelling -- Fresnel equations -- thin films -- photoluminescence; Synchrotron radiation -- Periodicals; Free electron lasers -- Periodicals; 539.73505
• DOI: 10.1107/S0909049513002835
• Languages: English
• ISSNs: 0909-0495

Abstract

Abstract : The problem of exciting UV and VUV light interference affecting experimental photoluminescence excitation spectra is analysed for the case of thin transparent films containing arbitrarily distributed emission centres. A numerical technique and supplied software aimed at modelling the phenomenon and correcting the distorted spectra are proposed. Successful restoration results of the experimental synchrotron data for ion‐implanted silica films show that the suggested method has high potential.