A microfocus X‐ray fluorescence beamline at Indus‐2 synchrotron radiation facility. (8th February 2013)

• Record Type: Journal Article
• Authors: Tiwari, M. K.; Gupta, P.; Sinha, A. K.; Kane, S. R.; Singh, A. K.; Garg, S. R.; Garg, C. K.; Lodha, G. S.; Deb, S. K.
• Is Part Of: Journal of synchrotron radiation. Volume 20:Part 2(2013)
• Page Start: 386
• Page End: 389
• Publication Date: 2013-02-08
• Subjects: X‐ray microscopy -- microprobe -- X‐ray fluorescence -- X‐ray scattering; Synchrotron radiation -- Periodicals; Free electron lasers -- Periodicals; 539.73505
• DOI: 10.1107/S0909049513001337
• Languages: English
• ISSNs: 0909-0495

Abstract

Abstract : A microfocus X‐ray fluorescence spectroscopy beamline (BL‐16) at the Indian synchrotron radiation facility Indus‐2 has been constructed with an experimental emphasis on environmental, archaeological, biomedical and material science applications involving heavy metal speciation and their localization. The beamline offers a combination of different analytical probes, e.g. X‐ray fluorescence mapping, X‐ray microspectroscopy and total‐external‐reflection fluorescence characterization. The beamline is installed on a bending‐magnet source with a working X‐ray energy range of 4–20 keV, enabling it to excite K ‐edges of all elements from S to Nb and L ‐edges from Ag to U. The optics of the beamline comprises of a double‐crystal monochromator with Si(111) symmetric and asymmetric crystals and a pair of Kirkpatrick–Baez focusing mirrors. This paper describes the performance of the beamline and its capabilities with examples of measured results.