Using a non‐monochromatic microbeam for serial snapshot crystallography. (15th May 2013)

• Record Type: Journal Article
• Authors: Dejoie, Catherine; McCusker, Lynne B.; Baerlocher, Christian; Abela, Rafael; Patterson, Bruce D.; Kunz, Martin; Tamura, Nobumichi
• Is Part Of: Journal of applied crystallography. Volume 46:Part 3(2013:Jun.)
• Page Start: 791
• Page End: 794
• Publication Date: 2013-05-15
• Subjects: X‐ray free‐electron lasers -- diffraction -- stationary crystals; Crystallography -- Periodicals; 548.05
• DOI: 10.1107/S0021889813005888
• Languages: English
• ISSNs: 0021-8898

Abstract

Abstract : The new X‐ray free‐electron laser source (SwissFEL) that is currently being developed at PSI will provide a broad‐bandpass mode with an energy bandwidth of about 4%. By using the full energy range, a new option for structural studies of crystalline materials may become possible. The proof of concept of broad‐bandpass diffraction presented here is based on Laue single‐crystal microdiffraction and the experimental setup on BL12.3.2 at the Advanced Light Source in Berkeley. Diffraction patterns for 100 randomly oriented stationary crystallites of theMFI ‐type zeolite ZSM‐5 were simulated assuming several bandwidths, and the statistical and structural results are discussed. With a 4% energy bandwidth, the number of reflection intensities measured in a single shot is significantly higher than with monochromatic radiation. Furthermore, the problem of partial reflection measurement, which is inherent to the monochromatic mode with stationary crystals, can be overcome.