Imaging interfacial micro‐ and nano‐bubbles by scanning transmission soft X‐ray microscopy. (17th March 2013)

• Record Type: Journal Article
• Authors: Zhang, Lijuan; Zhao, Binyu; Xue, Lian; Guo, Zhi; Dong, Yaming; Fang, Haiping; Tai, Renzhong; Hu, Jun
• Is Part Of: Journal of synchrotron radiation. Volume 20:Part 3(2013)
• Page Start: 413
• Page End: 418
• Publication Date: 2013-03-17
• Subjects: interfacial science -- nanobubbles -- scanning transmission soft X‐ray microscopy; Synchrotron radiation -- Periodicals; Free electron lasers -- Periodicals; 539.73505
• DOI: 10.1107/S0909049513003671
• Languages: English
• ISSNs: 0909-0495

Abstract

Abstract : Synchrotron‐based scanning transmission soft X‐ray microscopy (STXM) with nanometer resolution was used to investigate the existence and behavior of interfacial gas nanobubbles confined between two silicon nitride windows. The observed nanobubbles of SF6 and Ne with diameters smaller than 2.5 µm were quite stable. However, larger bubbles became unstable and grew during the soft X‐ray imaging, indicating that stable nanobubbles may have a length scale, which is consistent with a previous report using atomic force microscopy [Zhang et al. (2010), Soft Matter, 6, 4515–4519]. Here, it is shown that STXM is a promising technique for studying the aggregation of gases near the solid/water interfaces at the nanometer scale.