Correlative electron and X-ray microscopy: probing chemistry and bonding with high spatial resolution. Issue 5 (23rd December 2014)

• Record Type: Journal Article
• Authors: Goode, Angela E.; Porter, Alexandra E.; Ryan, Mary P.; McComb, David W.
• Is Part Of: Nanoscale. Volume 7:Issue 5(2015)
• Page Start: 1534
• Page End: 1548
• Publication Date: 2014-12-23
• Subjects: Nanoscience -- Periodicals; Nanotechnology -- Periodicals; 620.505
• DOI: 10.1039/c4nr05922k
• Languages: English
• ISSNs: 2040-3364

Abstract

Abstract : Benefits and challenges of correlative spectroscopy: electron energy-loss spectroscopy in the scanning transmission electron microscope (STEM-EELS) and X-ray absorption spectroscopy in the scanning transmission X-ray microscope (STXM-XAS). Abstract : Two powerful and complementary techniques for chemical characterisation of nanoscale systems are electron energy-loss spectroscopy in the scanning transmission electron microscope, and X-ray absorption spectroscopy in the scanning transmission X-ray microscope. A correlative approach to spectro-microscopy may not only bridge the gaps in spatial and spectral resolution which exist between the two instruments, but also offer unique opportunities for nanoscale characterisation. This review will discuss the similarities of the two spectroscopy techniques and the state of the art for each microscope. Case studies have been selected to illustrate the benefits and limitations of correlative electron and X-ray microscopy techniques. In situ techniques and radiation damage are also discussed.