Cite
HARVARD Citation
Li, S. et al. (2015). Breakdown of metallic single-wall carbon nanotube paths by NiO nanoparticle point etching for high performance thin film transistors. Nanoscale. 7 (4), pp. 1280-1284. [Online].
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Li, S. et al. (2015). Breakdown of metallic single-wall carbon nanotube paths by NiO nanoparticle point etching for high performance thin film transistors. Nanoscale. 7 (4), pp. 1280-1284. [Online].