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Ko, Y. et al. (n.d.). Predictive modeling and analysis of HfO2 thin film process based on Bayesian information criterion using PCA‐based neural networks. Surface and interface analysis. pp. 1334-1339. [Online].
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Ko, Y. et al. (n.d.). Predictive modeling and analysis of HfO2 thin film process based on Bayesian information criterion using PCA‐based neural networks. Surface and interface analysis. pp. 1334-1339. [Online].