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Chulapakorn, T. et al. (2016). MeV ion irradiation effects on the luminescence properties of Si‐implanted SiO2‐thin films. Physica status solidi. 13 (10), pp. 921-926. [Online].
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Chulapakorn, T. et al. (2016). MeV ion irradiation effects on the luminescence properties of Si‐implanted SiO2‐thin films. Physica status solidi. 13 (10), pp. 921-926. [Online].