Graphene: Probing Bilayer Grain Boundaries in Large‐Area Graphene with Tip‐Enhanced Raman Spectroscopy (Adv. Mater. 7/2017). Issue 7 (February 2017)

• Record Type: Journal Article
• Authors: Park, Kyoung‐Duck; Raschke, Markus B.; Atkin, Joanna M.; Lee, Young Hee; Jeong, Mun Seok
• Is Part Of: Advanced materials. Volume 29:Issue 7(2017)
• Page Start: n/a
• Page End: n/a
• Publication Date: 2017-02
• Subjects: bilayer graphene -- grain boundaries -- hybridization -- sp3 -- stacking angles -- tip‐enhanced Raman spectroscopy (TERS) -- wrinkles; Materials -- Periodicals; Chemical vapor deposition -- Periodicals; 620.11
• DOI: 10.1002/adma.201770048
• Languages: English
• ISSNs: 0935-9648

Abstract

Abstract : A twisted stacking bilayer structure of grain boundaries in large‐area graphene is revealed by Mun Seok Jeong and co‐workers in article number 1603601 from high‐spatial‐resolution (<18 nm) correlated analysis of topography, near‐field scattering, and hyperspectral tip‐enhanced Raman spectroscopy (TERS) imaging. The demonstrated analytical results of bilayer grain boundaries deliver an informative guide toward the design of future graphene devices; furthermore, this approach will be generally applicable to a range of two‐dimensional materials beyond graphene.