Ultrasensitive SERS Detection by Defect Engineering on Single Cu2O Superstructure Particle. Issue 5 (28th November 2016)

• Record Type: Journal Article
• Authors: Lin, Jie; Shang, Yang; Li, Xiaoxia; Yu, Jian; Wang, Xiaotian; Guo, Lin
• Is Part Of: Advanced materials. Volume 29:Issue 5(2017)
• Page Start: n/a
• Page End: n/a
• Publication Date: 2016-11-28
• Subjects: charge‐transfer -- defects -- electrostatic adsorption -- self‐assembly -- single‐particle SERS; Materials -- Periodicals; Chemical vapor deposition -- Periodicals; 620.11
• DOI: 10.1002/adma.201604797
• Languages: English
• ISSNs: 0935-9648

Abstract

Abstract : A Cu2 O superstructure is constructed through a recrystallization‐induced self‐assembly strategy . Single Cu2 O superstructure particle exhibits an outstanding surface‐enhanced Raman spectroscopy performance with the limit of detection as low as 10 −9 mol L −1 and metal comparable enhancement factor (8 × 10 5 ) due to the synergetic effect of vacancies defect‐facilitated charge‐transfer process and copper vacancies defect‐induced electrostatic adsorption.