Probing Bilayer Grain Boundaries in Large‐Area Graphene with Tip‐Enhanced Raman Spectroscopy. Issue 7 (9th December 2016)

• Record Type: Journal Article
• Authors: Park, Kyoung‐Duck; Raschke, Markus B.; Atkin, Joanna M.; Lee, Young Hee; Jeong, Mun Seok
• Is Part Of: Advanced materials. Volume 29:Issue 7(2017)
• Page Start: n/a
• Page End: n/a
• Publication Date: 2016-12-09
• Subjects: bilayer graphene -- grain boundaries -- hybridization -- sp3 -- stacking angles -- tip‐enhanced Raman spectroscopy (TERS) -- wrinkles; Materials -- Periodicals; Chemical vapor deposition -- Periodicals; 620.11
• DOI: 10.1002/adma.201603601
• Languages: English
• ISSNs: 0935-9648

Abstract

Abstract : The bilayer grain boundaries (GBs) in chemical‐vapor‐deposition‐grown large‐area graphene are identified using multispectral tip‐enhanced Raman imaging with 18 nm spatial resolution. The misorientation angle of the bilayer GBs is determined from a quantitative analysis of the phonon‐scattering properties associated with the modified electronic structure.