Artificial peaks in energy dispersive X‐ray spectra: sum peaks, escape peaks, and diffraction peaks. (2nd May 2016)

• Record Type: Journal Article
• Authors: Tanaka, Ryohei; Yuge, Koretaka; Kawai, Jun; Alawadhi, Hussain
• Is Part Of: X-ray spectrometry. Volume 46:Number 1(2017)
• Page Start: 5
• Page End: 11
• Publication Date: 2016-05-02
• Subjects: X-ray spectroscopy -- Periodicals; 543.62
• DOI: 10.1002/xrs.2697
• Languages: English
• ISSNs: 0049-8246

Abstract

Abstract : Sum peaks, escape peaks, and diffraction peaks are considered artificial or spurious peaks in energy dispersive X‐ray spectrometry. Experimental examples are given, which showed that escape and diffraction peaks can add up to become sum peaks. These artificial peaks are not weak, and great care must be taken to differentiate them from peaks due to impurity or trace elements. The relationship between the intensity of a sum peak and the original peaks is illustrated using computer simulation as well as probability theory. Copyright © 2016 John Wiley & Sons, Ltd.