Cite
HARVARD Citation
Deng, M. et al. (2017). Small-signal characterization and modelling of 55 nm SiGe BiCMOS HBT up to 325 GHz. Solid-state electronics. pp. 150-156. [Online].
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
Deng, M. et al. (2017). Small-signal characterization and modelling of 55 nm SiGe BiCMOS HBT up to 325 GHz. Solid-state electronics. pp. 150-156. [Online].