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HARVARD Citation
Kriso, C. et al. (2017). Modeled optical properties of SiGe and Si layers compared to spectroscopic ellipsometry measurements. Solid-state electronics. pp. 93-96. [Online].
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Kriso, C. et al. (2017). Modeled optical properties of SiGe and Si layers compared to spectroscopic ellipsometry measurements. Solid-state electronics. pp. 93-96. [Online].